Design-for-Testability and Analog Built-in Self-Tests

Research Period: January 1, 2001 – August 31, 2001

Description:
This is research in design-for-testability and built-in-self-test of mixed-signal CMOS integrated circuits sponsored by Agere (former Lucent Technologies). Collaborators include UNC-Charlotte graduate research assistant and staff engineers/scientists at Agere.

UNC-Charlotte graduate research assistants:

• Clark Hopper, Master's student. cehopper@uncc.edu

Contact Information:
Department of Electrical and Computer Engineering
The University of North Carolina at Charlotte
9201 University City Blvd.
Charlotte, NC 28223

Phone: 704-687-3785
Fax: 704-687-2352

Office: 226 Cameron Applied Research Center