^I_DDT ^Testing       

Research Period: August 1, 2000 – 

Description:

This is a collaboration of research and development of new CMOS current sensors/electronics for I_DDT testing with the UNCC faculty member and inventor of the I_DDT transient supply current test method for testing digital integrated circuits, Dr. Rafic Makki. Collaboration include UNCC graduate students Nikhil Anand and Sreedhar Sivalingala.